Characterization of tungsten tips for STM by SEM/AES/XPS
نویسندگان
چکیده
منابع مشابه
Characterization of tungsten tips for STM by SEM/AES/XPS
For the first time, both X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques were applied in analysis of surface contamination of electrochemically etched Scanning Tunneling Microscope (STM) tungsten tips. Carbon monoxide, graphite, tungsten carbide and tungsten oxide were found as main surface contaminations of STM tungsten tips. The thickness of tungsten ox...
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ژورنال
عنوان ژورنال: Fresenius' Journal of Analytical Chemistry
سال: 1991
ISSN: 0937-0633,1432-1130
DOI: 10.1007/bf00321548